ISO 23729:2022
International Standard
Current Edition
·
Approved on
13 July 2022
Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
ISO 23729:2022 Files
English
15 Pages
Current Edition
43.82 OMR
ISO 23729:2022 Scope
This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.
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